Specifications | |
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 20.0mm |
Layer | Layer1: cu wiring |
Metal Material | Cu |
Cu Thickness | 1.5 ~ 2.5μm |
Number of Pad | 56 pads |
Pad Size | 160μm |
Measurement Pad Size | 2.0mm / 0.9mm |
Number of Chip | 57 chips/wafer |
Evaluation Pattern |
・Comb pattern Comb pattern L/S dimension ・Wiring pattern for break check 10.0μm, 2.0μm, 1.5μm, 1.0μm(length: 2.0mm, 1.0mm) |